Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Stimulated emission-depletion (STED) microscopy based on time gating of excitation beam and synchronous detection of fluorescence emission

Stimulated emission-depletion (STED) microscopy based on time gating of excitation beam and synchronous detection of fluorescence emission

US Patent 9772285 · Granted Sep 26, 2017

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method and microscope for recording trajectories of individual particles in a sa2025
Method and device for illuminating a sample in a microscope in points2025
Method of disturbance correction, and laser scanning microscope having disturban2025
Method and light microscope for a high-resolution examination of a sample2024
Time-resolved imaging method with high spatial resolution2022
Time-resolved imaging method with high spatial resolution2022
Method of stimulated emission depletion microscopy having high spatial resolutio2022
Method of stimulated emission depletion microscopy having high spatial resolutio2022
Method of aligning a laser-scanning fluorescence microscope and laser-scanning f2021
Method of lightening at least one biological sample, three-dimensional high reso2021
Microscopy method and apparatus for optical tracking of emitter objects2020
Methods of high-resolution imaging a structure of a sample, the structure being 2019