Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Charged particle image measuring device and imaging mass spectrometry apparatus

Charged particle image measuring device and imaging mass spectrometry apparatus

US Patent 9754772 · Granted Sep 5, 2017

Estimated economic value: $38,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Solar power generation panel structure and reinforcing plate for solar power gen2025
Multi-electron beam writing apparatus and multi-electron beam writing method2025
Structure for installation of solar power generation panel on roof2025
Photoelectric-surface electron source2024
Method for producing metal nanoparticles, method for producing membrane electrod2024
Sliding component and method of manufacturing sliding member2023
Processing apparatus2023
Semiconductor device and error detection methods2023
Electron beam irradiation apparatus and electron beam irradiation method2023
Sliding components2023
Multiple electron beam writing apparatus and multiple electron beam writing meth2023
Sliding components2022