Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Data retention control circuit, data writing method, data reading method, method of testing characteristics of ferroelectric storage device, and semiconductor chip

Data retention control circuit, data writing method, data reading method, method of testing characteristics of ferroelectric storage device, and semiconductor chip

US Patent 9601177 · Granted Mar 21, 2017

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Synchronous reset signal generation circuit and digital processing device2024
Semiconductor integrated circuit2022
Flip flop circuit and data processing apparatus2021
Semiconductor memory apparatus2020
Data processing apparatus, structure and power generation apparatus including th2019
Data holding device, nonvolatile data holding device, and data reading method2019
C-plane GaN substrate2019
C-plane GaN substrate2019
Method of producing periodic table group 13 metal nitride semiconductor crystal 2018
Electronic circuit and electronic device including the same2015
Nonvolatile storage gate, operation method for the same, and nonvolatile storage2015
Data holding device and logic operation circuit using the same2015