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Home › Circuitry and method for measuring negative bias temperature instability (NBTI) and hot carrier injection (HCI) aging effects using edge sensitive sampling

Circuitry and method for measuring negative bias temperature instability (NBTI) and hot carrier injection (HCI) aging effects using edge sensitive sampling

US Patent 9564884 · Granted Feb 7, 2017

Estimated economic value: $8,990,000 ⓘ

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