Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Test circuit for very low voltage and bias scan testing of integrated circuit

Test circuit for very low voltage and bias scan testing of integrated circuit

US Patent 9551749 · Granted Jan 24, 2017

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Cover material attachment2025
Methods for producing transgenic plants2023
Bias current generator circuit2023
Analogue switch arrangement2023
Anti-armyworm use of CRY1AB/CRY1ACZM gene2023
Insect-resistant herbicide-tolerant corn transformation event2022
Buffer stage for use with a current controlled oscillator2021
Methods for producing transgenic plants2021
Current-controlled oscillator with start-up circuit2020
Gene for encoding Bacillus thuringiensis crystal proteins, and use thereof2020
Integrated circuit with low power scan system2019
Low temperature coefficient clock signal generator2018