Profiling tool for determining material thickness for inspection sites having complex topography

Assignee

• Atomic Energy Of Canada Limited

Inventors

• Michel Gaudet (5 patents)
• Robert Hayden Lumsden (1 patents)
• Glenn Curtis Longhurst (1 patents)
• Kristopher Jones (3 patents)
• Stuart Thomas Craig (6 patents)
• David Walter Dunford (1 patents)
• Paul Adams (7 patents)
• Kenneth Robert Chaplin (2 patents)
• Helene Marie Hebert (1 patents)

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