Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method for testing mainframe performance of different types of partial discharge detectors based on analog voltage signal injection

Method for testing mainframe performance of different types of partial discharge detectors based on analog voltage signal injection

US Patent 9513360 · Granted Dec 6, 2016

Assignee

No assignee recorded.

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Back plate and manufacturing method thereof, method for bonding chip, and displa2025
Substrate and method for manufacturing the same, and display panel2025
Method for manufacturing fully self-aligned high-density 3D multi-layer memory2025
Display panel and method for manufacturing a display panel having a tiled screen2025
Malware detection and mitigation system and method therefor2025
Intermediate substrate and fabrication method of display panel2025
Display panel, manufacturing method thereof, and display device2025
Array substrate and display panel including electrically connected gates2025
Method for preventing fall of operator, controller, safety belt and storage medi2025
Method for preventing fall of operator, controller, safety belt and storage medi2025
Method for preventing fall of operator, controller, safety belt and storage medi2025
Method for preventing fall of operator, controller, safety belt and storage medi2025