Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Control of base station parameters based on mapping of terminal distribution

Control of base station parameters based on mapping of terminal distribution

US Patent 9445374 · Granted Sep 13, 2016

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Methods for increasing the density of high-index nanoimprint lithography films2025
Counterweight for a construction machine2025
Interfacial layer for optical film performance2024
Methods for encapsulating silver mirrors on optical structures2024
Titanium oxide optical device films deposited by physical vapor deposition2024
Light emitting element array and optical measuring system2024
Methods for increasing the density of high-index nanoimprint lithography films2024
Methods and systems to modulate film stress2024
Working machine2024
Imprint compositions with passivated nanoparticles and materials and processes f2024
Methods for refurbishing aerospace components2023
Methods of protecting aerospace components against corrosion and oxidation2023