Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › In-plane scanning probe microscopy tips and tools for wafers and substrates with diverse designs on one wafer or substrate

In-plane scanning probe microscopy tips and tools for wafers and substrates with diverse designs on one wafer or substrate

US Patent 9423693 · Granted Aug 23, 2016

Assignee

No assignee recorded.

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method and apparatus for nanolapping2020
Diamond structures as fuel capsules for nuclear fusion2019
Superconducting power and transport system2019
Carbon nanotube probes and structures and methods of measurement2019
In-plane scanning probe microscopy tips and tools for wafers and substrates with2018
User identification for weapons and site sensing fire control2018
Molded plastic cartridge with extended flash tube, sub-sonic cartridges, and use2018
In-plane scanning probe microscopy tips and tools for wafers and substrates with2017
Molded plastic cartridge with extended flash tube, sub-sonic cartridges, and use2016
Fluid delivery for scanning probe microscopy2015
Scalable transaction system for a network environment2015
Angle control of multi-cavity molded components for MEMS and NEMS group assembly2014