Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Scanning probe microscope and sample observation method using same

Scanning probe microscope and sample observation method using same

US Patent 9417262 · Granted Aug 16, 2016

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Spectroscopic measurement device2025
Optical inspection method and optical inspection apparatus2016
Optical filtering device, defect inspection method and apparatus therefor2015
Internal defect inspection method and apparatus for the same2015
Scanning probe microscope and measurement method using same2015
Defect inspection method and apparatus therefor2014
Polarizing different phases of interfered light used in a method and apparatus f2014
Scanning probe microscope2014
Scanning probe microscope2014
Method of defect inspection and device of defect inspection2014
Thermally assisted magnetic recording head inspection method and apparatus2014
Pattern inspection device of substrate surface and pattern inspection method of 2014