Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Inline inspection of the contact between conductive traces and substrate for hidden defects using white light interferometer with tilted objective lens

Inline inspection of the contact between conductive traces and substrate for hidden defects using white light interferometer with tilted objective lens

US Patent 9389064 · Granted Jul 12, 2016

Estimated economic value: $10,128,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Systems and methods for controlling user data consumption2025
Lamp unit and lamp system2025
Strip mounting system for mounting strip2025
Shutter disk for physical vapor deposition (PVD) chamber2025
Automatic chassis lifting mechanism for treadmill2025
High-power large-aperture fundamental mode vortex optical waveguide coherent VCS2025
High-temperature resistant, peelable and anti-corrosion coating, preparation met2025
TEC-embedded dummy die to cool the bottom die edge hotspot2025
Treadmill2025
Treadmill2025
Automatically executing application routines with user inputs2025
Device for forming light strip installation pattern and method for installing li2025