Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Systems and methods for preparation of samples for sub-surface defect review

Systems and methods for preparation of samples for sub-surface defect review

US Patent 9318395 · Granted Apr 19, 2016

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Communication method and apparatus, device, system, chip and storage medium2025
Real-time detecting system for the mechanical quality state of ballast bed based2025
Voltage-reduced lithium battery and manufacturing method thereof2025
Cleanroom compatible robotic end effector exchange system2025
1.5V lithium battery and manufacturing method thereof2024
Virtual reality-based derailment accident passenger comfort degree monitoring sy2024
Pyridopyrazine and pyridotriazine inhibitors of influenza virus replication2024
Overlay measurement targets design2024
System and method of preparing integrated circuits for backside probing using ch2023
Defect inspection and review using transmissive current image of charged particl2022
Auto phase control drive circuit for gyroscope apparatus2021
Scanning type laser induced spectrum analysis and detection system2020