{"@context": "https://schema.org", "@type": "BreadcrumbList", "itemListElement": [{"@type": "ListItem", "position": 1, "name": "Home", "item": "https://www.patentleaderboard.com/"}, {"@type": "ListItem", "position": 2, "name": "Apparatus and method for controlling the reliability stress rate on a processor", "item": "https://www.patentleaderboard.com/patent/9317389"}]}

Home › Apparatus and method for controlling the reliability stress rate on a processor

Apparatus and method for controlling the reliability stress rate on a processor

US Patent 9317389 · Granted Apr 19, 2016

Estimated economic value: $11,756,000 ⓘ

Assignee

Intel

Inventors

Dorit Shapira (20 patents)
Krishnakanth V. Sistla (115 patents)
Efraim Rotem (13 patents)
Nadav Shulman (68 patents)
Shmulik Zobel (1 patents)
Allen W. Chu (4 patents)

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