Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Programmable test chip, system and method for characterization of integrated circuit fabrication processes

Programmable test chip, system and method for characterization of integrated circuit fabrication processes

US Patent 9275187 · Granted Mar 1, 2016

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Event-based sensor system and method for operating an event-based sensor system2025
Methods and systems for signal sampling using spatial dispersion and photonics a2025
Analog-to-information conversion using analog pre-processing sensing of multi-ba2025
Column-parallel ADC architectures for high-speed CMOS image sensors2024
Programmable test structure for characterization of integrated circuit fabricati2018