Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Testing system with capacitively coupled probe for evaluating electronic device structures

Testing system with capacitively coupled probe for evaluating electronic device structures

US Patent 9274142 · Granted Mar 1, 2016

Estimated economic value: $57,077,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Systems and methods for testing multiple mmWave antennas2023
Electromagnetic shielded testing chamber with ventilation2023
Flexible printed circuit structures for electronic device antennas2021
Multiband antennas formed from bezel bands with gaps2017
Methodology and apparatus for testing conductive adhesive within antenna assembl2016
Radio-frequency test system with tunable test antenna circuitry2016
Non-contact test system for determining whether electronic device structures con2016
Antenna with switchable inductor low-band tuning2016
Methods for reducing path loss while testing wireless electronic devices with mu2016
Methods for reducing path loss while testing wireless electronic devices with mu2016
Methods and apparatus for testing small form factor antenna tuning elements2016
Test probe alignment structures for radio-frequency test systems2016