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Home › Method and system for in-line real-time measurements of layers of multilayered front contacts of photovoltaic devices and calculation of opto-electronic properties and layer thicknesses thereof

Method and system for in-line real-time measurements of layers of multilayered front contacts of photovoltaic devices and calculation of opto-electronic properties and layer thicknesses thereof

US Patent 9245808 · Granted Jan 26, 2016

Estimated economic value: $21,359,000 ⓘ

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