Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Metrology for contactless measurement of electrical resistance change in magnetoresistive samples

Metrology for contactless measurement of electrical resistance change in magnetoresistive samples

US Patent 9194908 · Granted Nov 24, 2015

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Integrated optical nanoscale probe2018
Integrated optical nanoscale probe measurement of electric fields from electric 2017
Integrated optical nanoscale probe2017
Photon emitter characterization using photoluminescence quenching in nitrogen va2016
Magnetic write head characterization with nano-meter resolution using nitrogen v2016
Magnetic write head characterization with nano-meter resolution using nitrogen v2014
Magneto-optical detection of a field produced by a sub-resolution magnetic struc2014
Sub-optical-resolution kerr signal detection for perpendicular write-head charac2013
Magneto-optic write-head characterization using the recording medium as a transd2012