Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Apparatus and method to monitor die edge defects

Apparatus and method to monitor die edge defects

US Patent 9159646 · Granted Oct 13, 2015

Estimated economic value: $14,687,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Systems and methods for controlling user data consumption2025
Lamp unit and lamp system2025
Strip mounting system for mounting strip2025
Shutter disk for physical vapor deposition (PVD) chamber2025
Automatic chassis lifting mechanism for treadmill2025
High-power large-aperture fundamental mode vortex optical waveguide coherent VCS2025
High-temperature resistant, peelable and anti-corrosion coating, preparation met2025
Treadmill2025
Treadmill2025
Device for forming light strip installation pattern and method for installing li2025
Lighting control method, lighting control device and lighting device2025
Lamp unit, lamp system and method for mounting lamp system2025