Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › System and method to map defect reduction data to organizational maturity profiles for defect projection modeling

System and method to map defect reduction data to organizational maturity profiles for defect projection modeling

US Patent 9052981 · Granted Jun 9, 2015

Estimated economic value: $3,292,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

System and method for resource modeling and simulation in test planning2019
System and method for resource modeling and simulation in test planning2019
System and method to produce business case metrics based on defect analysis star2019
System and method to produce business case metrics based on defect analysis star2019
System and method to produce business case metrics based on defect analysis star2019
System and method for efficient creation and reconciliation of macro and micro l2019
System and method for efficient creation and reconciliation of macro and micro l2019
System and method for efficient creation and reconciliation of macro and micro l2019
Change-request analysis2019
System and method to classify automated code inspection services defect output f2017
System and method to classify automated code inspection services defect output f2017
System and method to map defect reduction data to organizational maturity profil2017