Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method of in-process intralayer yield detection, interlayer shunt detection and correction

Method of in-process intralayer yield detection, interlayer shunt detection and correction

US Patent 9035673 · Granted May 19, 2015

Estimated economic value: $4,428,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Printer jetting mechanism and printer employing the printer jetting mechanism2024
Systems and methods for improved object placement sensing for point-of-purchase 2024
Heat image forming device and method2023
Method of jetting print material and method of printing2023
Object identification2023
Matrix-addressed heat image forming device2023
Printable unclonable function patterns2023
Optical sensor system to identify objects and their movement2023
Method of direct etching fabrication of waveguide combiners2023
Tag system with a modulator of an antenna modulator and methods of use2023
Apparatus and method for creating crack initiation sites in a self-fracturing fr2022
Method of direct etching fabrication of waveguide combiners2022