Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and apparatus for nanomechanical measurement using an atomic force microscope

Method and apparatus for nanomechanical measurement using an atomic force microscope

US Patent 8973161 · Granted Mar 3, 2015

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

High speed adaptive-multi-loop mode imaging atomic force microscopy2018
High speed adaptive-multi-loop mode imaging atomic force microscopy2018
Optimal excitation force design indentation-based rapid broadband nanomechanical2013
Fast positioning of disk drives and other physical systems2006