Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method for measuring a piezoelectric response by means of a scanning probe microscope

Method for measuring a piezoelectric response by means of a scanning probe microscope

US Patent 8950010 · Granted Feb 3, 2015

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Scanning probe microscope and method for operating the same2013
Scanning probe microscope with current controlled actuator2012
Scanning probe microscope with periodically phase-shifted AC excitation2012
High resolution digital analog conversion circuit2010