Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method for measuring cracks remotely and device thereof

Method for measuring cracks remotely and device thereof

US Patent 8908195 · Granted Dec 9, 2014

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method and system of adaptably detecting dirt, occlusion and smudge on camera le2025
Semiconductor structure and semiconductor device2024
Semiconductor structure2024
Heat-shrinkable polyester film and method for manufacturing the same2024
Semiconductor structure, high electron mobility transistor and fabrication metho2024
Semiconductor structure and high electron mobility transistor2024
Semiconductor substrate, semiconductor device, and method for forming semiconduc2023
Semiconductor device2023
Data processing method and memory controller utilizing the same2023
Methods for forming fluorine doped high electron mobility transistor (HEMT) devi2023
Integrated device for laser ranging and imaging2022
Reflective condensing interferometer2022