Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Circuit for canceling errors caused by parasitic and device-intrinsic resistances in temperature dependent integrated circuits

Circuit for canceling errors caused by parasitic and device-intrinsic resistances in temperature dependent integrated circuits

US Patent 8878597 · Granted Nov 4, 2014

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Measuring ion strength using closed-loop electrochemical ph modulation2025
Monoblock sensor body and method of its manufacturing2024
Electronic control of the pH of a solution close to an electrode surface2024
Interleaved ring oscillator for non-overlapping clock2023
Edge sequencing with an immobilized translocator2023
Segmented digital to optical phase-shift converter2023
Method for the verification of pipettes2023
Hands-free page turning for sheet music2023
Closed-loop PH control with differential sensor2023
Electronic control of the pH of a solution close to an electrode surface2023
Hysteretic control of a boost converter2022
Low power and low data-rate imager2022