Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Systems and methods for characterizing near field transducer performance at wafer level using asymmetric interference waveguides

Systems and methods for characterizing near field transducer performance at wafer level using asymmetric interference waveguides

US Patent 8836949 · Granted Sep 16, 2014

Estimated economic value: $16,241,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Systems and methods for light detection in LIDAR systems2025
Method for characterizing lidar point cloud quality2024
Silicon photomultiplier based LiDAR2024
Enhanced sensor health and regression testing for vehicles2024
Systems and methods for characterizing spectral reflectance of real world object2024
Saw blade2023
Systems and methods for characterizing spectral reflectance of real world object2022
Programmable and reconfigurable mask with MEMS micro-mirror array for defect det2022
Scanning LIDAR system using a curved rotating surface2020
Haze mask system for haze suppression2019
Method and system for providing a HAMR writer including a multi-mode interferenc2019
Heat assisted magnetic recording write apparatus having an inverse tapered waveg2018