Assignee
Inventors
- Gabriel Aeppli (5 patents)
- Benjamin Dueck (1 patents)
{"@context": "https://schema.org", "@type": "BreadcrumbList", "itemListElement": [{"@type": "ListItem", "position": 1, "name": "Home", "item": "https://www.patentleaderboard.com/"}, {"@type": "ListItem", "position": 2, "name": "Apparatus and method for measuring deformation of a cantilever using interferometry", "item": "https://www.patentleaderboard.com/patent/8797547"}]}
Skip to contentUS Patent 8797547 · Granted Aug 5, 2014