Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Reticle defect inspection with systematic defect filter

Reticle defect inspection with systematic defect filter

US Patent 8718353 · Granted May 6, 2014

Estimated economic value: $20,705,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Bird cage cover2024
Bird toy2024
Casting furnace featuring submerged, mechanical control of liquid level2024
Double-acting switch valve2024
Overlay alignment mark and method for measuring overlay error2024
Method and apparatus for data processing2023
Camera assembly and monitoring camera2023
Copper billet horizontal continuous casting apparatus and process with a vertica2023
Zooming method for imaging device, and image processing method and imaging devic2023
Image capture device includes white light lamp and infrared lamp for capturing b2021
Variable magnification method and camera2021
Method and apparatus for data processing2021