Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Terahertz-infrared ellipsometer system, and method of use

Terahertz-infrared ellipsometer system, and method of use

US Patent 8705032 · Granted Apr 22, 2014

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Sample alignment system in reflectometers, ellipsometers, spectrophotometers and2025
System for, and calibration and testing of directed beam ellipsometer systems2025
System for, and calibration and testing of directed beam ellipsometer systems2025
Reflectometer, spectrophotometer, ellipsometer or polarimeter system including s2024
Fast and accurate Mueller matrix infrared ellipsometer2023
Fast and accurate Mueller matrix infrared ellipsometer2023
Fast and accurate mueller matrix infrared spectroscopic ellipsometer2023
Fast and accurate mueller matrix infrared spectroscopic ellipsometer2023
Reflectometer, spectrophotometer, ellipsometer and polarimeter system with a sup2023
Reflectometer, spectrophotometer, ellipsometer and polarimeter system with a sup2023
Reflectometer, spectrophotometer, ellipsometer and polarimeter system with a sup2023
Snapshot ellipsometer2022