Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method for testing a microelectromechanical device, microelectromechanical device

Method for testing a microelectromechanical device, microelectromechanical device

US Patent 8661871 · Granted Mar 4, 2014

Estimated economic value: $2,961,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Temperature-compensated micro-electromechanical device, and method of temperatur2021
Oscillator circuit, and related integrated circuit2020
Method and system for compensating systematic non-linearities of a signal provid2018
Method of manufacturing a temperature-compensated micro-electromechanical device2018
Substrate-level assembly for an integrated device, manufacturing process thereof2018
Method and a device for analog-to-digital conversion of signals, corresponding a2017
Configurable analog front-end for mutual capacitance sensing and self capacitanc2016
Configurable analog front-end for mutual capacitance sensing and self capacitanc2016
Configurable analog front-end for mutual capacitance sensing and self capacitanc2016
Method and device for analog-to-digital conversion of signals, corresponding app2016
High signal to noise ratio capacitive sensing analog front-end2016
High signal to noise ratio capacitive sensing analog front-end2016