Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Integrated metrology systems and information and control apparatus for interaction with integrated metrology system

Integrated metrology systems and information and control apparatus for interaction with integrated metrology system

US Patent 8639390 · Granted Jan 28, 2014

Assignee

No assignee recorded.

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Business analysis tool using attribute groups2020
Method and system for communication system interoperability2018
Non-imaging solar concentrator and cosine factor correction device using compoun2017
Device and method for rendering and delivering 3-D content2016
Light concentrator structures and methods2016
Method and apparatus for in-building communications2015
Method and system for presence detection in a communication system2015
Device and method for rendering and delivering 3-D content2014
Light concentrator structures and methods2014
Method and apparatus for in-building communications2013
Integrated metrology systems and information and control apparatus for interacti2012
Integrated metrology systems and information and control apparatus for interacti2012