Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › System and method for improved testing of electronic devices

System and method for improved testing of electronic devices

US Patent 8598888 · Granted Dec 3, 2013

Estimated economic value: $570,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Testing and sorting system having a linear track and method of using the same2012
Electrical circuit component handler1998
Method and apparatus for forming termination stripes1998
Apparatus for stress testing capacitive components1997