Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › RAM single event upset (SEU) method to correct errors

RAM single event upset (SEU) method to correct errors

US Patent 8589759 · Granted Nov 19, 2013

Estimated economic value: $25,814,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Detecting condition of a shaft of a gas turbofan aircraft engine2025
Apparatus and methods for mitigating electromagnetic interference in an electron2022
Reduced error sensor fault detection2021
Sensor to sensor short detection2021
Method for managing over-temperature excursions in a failed-fixed control system2021
Multi-channel control switchover logic2020
DDR electronic module assembly2019
Multi-channel control switchover logic2017
Self-test of over-current fault detection2017
Apparatus and method for magnetically treating fluids2016
Vibration signal compensation2015
Detecting a relative shaft position on geared shafts2015