Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and apparatus for using an area X-ray detector as a point detector in an X-ray diffractometer

Method and apparatus for using an area X-ray detector as a point detector in an X-ray diffractometer

US Patent 8548123 · Granted Oct 1, 2013

Estimated economic value: $8,118,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Measurement of crystallite size distribution in polycrystalline materials using 2022
Two-dimensional X-ray detector position calibration and correction with diffract2019
X-ray diffraction device and method to measure stress with 2D detector and singl2019
Method and apparatus for extending angular coverage for a scanning two-dimension2019
Method for collecting accurate X-ray diffraction data with a scanning two-dimens2018
Method for measuring crystallite size with a two-dimensional X-ray diffractomete2011
X-ray diffractometer having co-exiting stages optimized for single crystal and b2010
Handheld two-dimensional X-ray diffractometer2010
Hybrid x-ray mirrors2008
Multiple wavelength X-ray source2008
Combinatorial screening system and X-ray diffraction and Raman spectroscopy2007
Multiple-position x-ray tube for diffractometer2007