Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Critical dimension control during template formation

Critical dimension control during template formation

US Patent 8545709 · Granted Oct 1, 2013

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Waveguides with high index materials and methods of fabrication thereof2025
Waveguides with high index materials and methods of fabrication thereof2025
Air pocket structures for promoting total internal reflection in a waveguide2025
Very high index eyepiece substrate-based viewing optics assembly architectures2025
Very high index eyepiece substrate-based viewing optics assembly architectures2025
Planarization system and method2025
System and method for modification of substrates2025
Broadband adaptive lens assembly for augmented reality display2025
Method and system for variable optical thickness waveguides for augmented realit2025
Eyepiece assembly adhesion using a zero residual layer region2025
Display device having diffraction gratings with reduced polarization sensitivity2025
Method of fabricating diffraction gratings2025