Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › System and method for memory testing in electronic circuits

System and method for memory testing in electronic circuits

US Patent 8495436 · Granted Jul 23, 2013

Estimated economic value: $6,830,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Automated training environment selection2024
Selective consumption of web page data over a data-limited connection2020
Method and apparatus for web ad matching2017
Circuit to reduce peak power during transition fault testing of integrated circu2014
Method, apparatus and computer readable medium for indexing advertisements to co2014
Electroporation buffer composition and method of use2013
Method for partitioning scan chain2013
Call back structures for user defined DOMs2007
General purpose shape-based layout processing scheme for IC layout modifications2003
Detergent bar comprising amorphous silica and salt of carboxylic and/or sulphoni2002