Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Probe card, and apparatus and method for testing semiconductor device using the probe card

Probe card, and apparatus and method for testing semiconductor device using the probe card

US Patent 8493087 · Granted Jul 23, 2013

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Hybrid supported metallocene catalyst and method of preparing polypropylene usin2025
Image processing device, operating method thereof, and display system including 2025
Display device including display elements and pixel circuits disposed in differe2025
Electronic device for performing audio streaming and operating method thereof2025
Process cartridge with toner receiving unit along pivot axis of development unit2025
Electronic device and sink device for transmitting and receiving audio packet, a2025
Electronic device and vehicle driver authentication method by the electronic dev2025
Dual drive Doherty power amplifier and systems and methods relating to same2025
Semiconductor device2025
Hybrid supported metallocene catalyst and method for preparing polypropylene usi2025
Front image generation device for heavy equipment2025
Display screen or portion thereof with graphical user interface2025