Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › High yield atmospheric pressure ion source for ion spectrometers in vacuum

High yield atmospheric pressure ion source for ion spectrometers in vacuum

US Patent 8481927 · Granted Jul 9, 2013

Estimated economic value: $3,311,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method for data transfer and communication system2025
Holding device for at least one filament and mass spectrometer2025
Ionization device and mass spectrometer2024
Correlative multimodal chemical imaging via machine learning2024
Method and transmission device for data transmission between two or more network2024
Mass spectrometer and method for analysing a gas by mass spectrometry2023
Mass spectrophotometric detection of microbes2023
Time-resolved chemical studies via time-of-flight secondary ion mass spectrometr2022
Turbo molecular pump for mass spectrometer2021
Mass spectrometric diagnosis of sepsis without blood culture2020
Mass spectrometric determination of microbial resistances2019
Ionization device with mass spectrometer therewith2019