Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › System for analyzing a low-pressure gas by optical emission spectroscopy

System for analyzing a low-pressure gas by optical emission spectroscopy

US Patent 8462335 · Granted Jun 11, 2013

Estimated economic value: $1,846,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Station and method for measuring airborne molecular contamination2025
Method for setting an airborne molecular contamination measurement station, and 2024
Station and method for measuring airborne molecular contamination2023
Device and method for controlling the tightness of a transport enclosure for the2022
Leak detection module and method for checking the seal-tightness of an object to2020
Method and station for measuring the contamination of a transport box for the at2019
Detection method and facility for checking sealed products for leaks2017
Detection method and facility for checking sealed products for leaks2017
Station and method for measuring particle contamination of a transport carrier f2017
Method and device for controlling the manufacture of semiconductor by measuring 2017
Detecting gaseous species by light-emission spectrometry with spectrum processin2008
Detecting minority gaseous species by light-emission spectroscopy2008