Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Test circuit and test method for testing differential input circuit

Test circuit and test method for testing differential input circuit

US Patent 8446163 · Granted May 21, 2013

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Semiconductor device having memory cell with electrostatic capacitance circuit2016
Semiconductor storage device2015
Semiconductor device2014
Non-volatile semiconductor memory device2013
Static random access memory (SRAM) and test method of the SRAM having precharge 2013
Static random access memory (SRAM) and test method of the SRAM having precharge 2012
Differential sense amplifier2012
Semiconductor integrated circuit and method of testing the same2012
Semiconductor storage device2012
SRAM and testing method of SRAM2011
Fuse data read circuit having control circuit between fuse and current mirror ci2011
Semiconductor integrated circuit device and inspection method of the same2009