Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Radio frequency integrated circuit with on-chip noise source for self-test

Radio frequency integrated circuit with on-chip noise source for self-test

US Patent 8421478 · Granted Apr 16, 2013

Estimated economic value: $3,567,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Systems and methods for targeted data discovery2025
Systems and methods for identifying data processing activities based on data dis2025
Systems and methods for identifying data processing activities based on data dis2024
Systems and methods for targeted data discovery2023
Systems and methods for identifying data processing activities based on data dis2023
Systems and methods for identifying data processing activities based on data dis2022
Providing transparency in private-user-data access2021
Configurable polarimetric phased array transceiver architecture2021
Scalable polarimetric phased array transceiver2021
Digital phase locked loop for low jitter applications2021
Systems for configuring and managing classroom devices2021
Tunable filters, cancellers, and duplexers based on passive mixers2020