Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Optical measuring instrument using both reflectometry and white-light interferometry

Optical measuring instrument using both reflectometry and white-light interferometry

US Patent 8416399 · Granted Apr 9, 2013

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Apparatus and method for the photothermal quality control of grain size and laye2021
Coupling device for a light guide2009
Fuel supply for internal combustion engines2006
Interferometric measuring device utilizing an active optical element2006
Interferometric measuring device2005
Method for three-dimensionally, optically measuring measuring objects2004