Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › 3D X-ray reflection microscopy imaging system

3D X-ray reflection microscopy imaging system

US Patent 8411821 · Granted Apr 2, 2013

Estimated economic value: $7,972,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Missile, slot thrust attitude controller system, and method2021
Device, system and method with burst mode laser source system forming laser-indu2019
Device, system and method with cascaded burst mode laser amplified pumping oscil2019
Missile, chemical plasm steering system, and method2018
Re-configurable coded inductive charging system2016
Modulated X-ray harmonic detection2015
X-ray explosive imager2015
Long cavity laser sensor for large FOV auto-tracking2014
Long cavity laser sensor for large FOV auto-tracking2014
Coruscative white light generator2014
Efficient burst mode optical parametric source2013
Efficient burst mode optical parametric source2013