Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › IC testing methods and apparatus

IC testing methods and apparatus

US Patent 8327205 · Granted Dec 4, 2012

Estimated economic value: $7,932,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Electrically insulated boots preventing unintended contact with live electrical 2025
Finger cluster connector for a rackable circuit breaker connecting with a ground2024
Low impact auxiliary switch mechanically operated contacts (MOC) mechanism2023
Testing of asynchronous reset logic2022
Testing of asynchronous reset logic2022
Limited pin test interface with analog test bus2020
Testing an integrated circuit device with multiple testing protocols2018
Method and system for digital circuit scan testing2016
Method of manufacturing a system in package2011
IC testing methods and apparatus2011
IC testing methods and apparatus2011
IC testing methods and apparatus2011