Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Integrated solution for identifying malfunctioning components within memory devices

Integrated solution for identifying malfunctioning components within memory devices

US Patent 8320207 · Granted Nov 27, 2012

Estimated economic value: $5,897,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Dynamically configurable SRAM cell for low voltage operation2016
Dynamically configurable SRAM cell for low voltage operation2016
SRAM memory device and testing method thereof2016
SRAM memory device and testing method thereof2016
Reliability test with monitoring of the results2015
Integrated solution for identifying malfunctioning components within memory devi2013
Integrated solution for identifying malfunctioning components within memory devi2013
5T SRAM memory for low voltage applications2013
5T SRAM memory for low voltage applications2013
Adjustable impedance SRAM memory device2013
Adjustable impedance SRAM memory device2013
Process and system for the verification of correct functioning of an on-chip mem2012