Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Evaluating high frequency time domain in embedded device probing

Evaluating high frequency time domain in embedded device probing

US Patent 8271220 · Granted Sep 18, 2012

Estimated economic value: $5,189,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Determining the current return path integrity in an electric device connected or2018
Measuring power consumption in an integrated circuit2017
Determining the current return path integrity in an electric device connected or2017
Determining the current return path integrity in an electric device connected or2016
Determining the current return path integrity in an electric device connected or2015
Network power fault detection2015
Determining local voltage in an electronic system2014
Method and system for performing self-tests in an electronic system2014
Evaluating high frequency time domain in embedded device probing2014
Evaluating high frequency time domain in embedded device probing2014
Method and system for impedance measurement in an integrated Circuit2013
Method for determining the current return path integrity in an electric device c2012