Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Apparatus and method for damage location and identification in structures

Apparatus and method for damage location and identification in structures

US Patent 8234924 · Granted Aug 7, 2012

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Apparatus and method for damage location and identification in structures2014
Apparatus and method for damage location and identification in structures2014
Apparatus and method for damage location and identification in structures2014
Bacteria sensor and method2010
Apparatus and method for high resolution temperature measurement and for hyperth2010
Image acquisition, processing, and display2009
Integrated optic devices and photosensitive sol-gel process for producing integr2009
Bi-directional PLC transceiver device2009
Optical waveguide structure2008
Integrated optic devices and photosensitive sol-gel process for producing integr2007
Imaging method and apparatus2007
Microarray scanning2006