Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and apparatus for generating electronic test and data structure

Method and apparatus for generating electronic test and data structure

US Patent 8225152 · Granted Jul 17, 2012

Estimated economic value: $19,113,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Operating electronic lock automatically based on user profile2018
Operating electronic lock automatically based on user profile2018
Method for reconstructing the characteristics of transmitted CDMA waveforms2013
Externally controllable electronic test program2007
Test executive system with tree structure for summarizing results2006
Electronic test program with run selection2006
Electronic test program that can distinguish results2006
Electronic test system and method2005
Test executive system with progress window2004
Electronic test program with test triggered interactive displays2004
Electronic test system with test results view filter2004
Batteryless power supply for transducers1994