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Home › Program testing method and testing device

Program testing method and testing device

US Patent 8214803 · Granted Jul 3, 2012

Estimated economic value: $4,930,000 ⓘ

Assignee

IBM

Inventors

Hiroshi Horii (147 patents)
Hisashi Miyashita (23 patents)
Hideki Tai (30 patents)

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