{"@context": "https://schema.org", "@type": "BreadcrumbList", "itemListElement": [{"@type": "ListItem", "position": 1, "name": "Home", "item": "https://www.patentleaderboard.com/"}, {"@type": "ListItem", "position": 2, "name": "Method and apparatus for testing an electronic circuit integrated with a semiconductor device", "item": "https://www.patentleaderboard.com/patent/8214706"}]}
Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and apparatus for testing an electronic circuit integrated with a semiconductor device

Method and apparatus for testing an electronic circuit integrated with a semiconductor device

US Patent 8214706 · Granted Jul 3, 2012

Estimated economic value: $3,005,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Portable tool bracket and portable tool2024
Element substrate, liquid discharge head, and printing apparatus2022
Liquid ejection head, liquid ejection apparatus, and control method2019
Liquid discharge head cleaning method and liquid discharge apparatus2018
Multi-plane data order2017
Multi-plane data order2017
Liquid ejection head, method of cleaning the same, and recording apparatus2017
Method for cleaning liquid ejection head2017
Liquid discharge head and method for producing liquid discharge head2017
Liquid ejection head, liquid ejecting apparatus, and method for manufacturing li2017
Method of cleaning liquid discharge head2016
Liquid discharge head and method of manufacturing the same2016