Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Curve tracer signal conversion for integrated circuit testing

Curve tracer signal conversion for integrated circuit testing

US Patent 8188760 · Granted May 29, 2012

Estimated economic value: $1,915,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Integrated circuit thermally induced noise analysis2014
System and method for in-situ inspection during metallurgical cross-sectioning2013
System and method for data synchronization2013
System and method for laser patterning an integrated circuit etching mask2013
Integrated circuit transmission line2013
Laser optical path detection2012
Optical-magnetic Kerr effect waveform testing2012
3-D mapping focused beam failure analysis2012
Socketless integrated circuit contact connector2012
Method for solid state thermal electric logic2011
Non-destructive laser optical integrated circuit package marking2011
Laser optical path detection in integrated circuit packaging2011